| LDR | | 00000cam u2200205 a 4500 |
| 001 | | 000000817606 |
| 005 | | 20190222144541 |
| 007 | | ta |
| 008 | | 070607s2006 njua 001 0 eng |
| 020 | | ▼a 9780471739067 |
| 020 | | ▼a 0471739065 |
| 040 | | ▼a 211043▼c 211043▼d 211043 |
| 082 | 04 | ▼a 621.38152▼2 22 |
| 090 | | ▼a 621.38152▼b S381s3 |
| 245 | 00 | ▼a Semiconductor material and device characterization /▼c Dieter K. Schroder. |
| 250 | | ▼a 3rd ed. |
| 260 | | ▼a [Piscataway, NJ] :▼b IEEE Press ;▼a Hoboken, N.J. :▼b Wiley,▼c 2006. |
| 300 | | ▼a xv, 779 p. :▼b ill. ;▼c 25 cm. |
| 500 | | ▼a "Wiley-Interscience." |
| 504 | | ▼a Includes bibliographical references and index(p. 755-779). |
| 650 | 0 | ▼a Semiconductors. |
| 650 | 0 | ▼a Semiconductors▼x Testing. |
| 700 | 1 | ▼a Schroder, Dieter K. |